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Volumn 20, Issue 43, 2009, Pages

Mapping real-time images of high-speed AFM using multitouch control

Author keywords

[No Author keywords available]

Indexed keywords

AFM; CONTROL ENVIRONMENT; CONTROL SOFTWARE; HIGH-SPEED AFM; MULTI-TOUCH; MULTITOUCH INTERFACE; NANOMETRE RESOLUTION; REAL-TIME IMAGES; SCAN RATES; SEQUENTIAL CONTROL;

EID: 70349694243     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/43/434018     Document Type: Article
Times cited : (20)

References (13)
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    • 33745634869 scopus 로고    scopus 로고
    • Components for high speed atomic force microscopy
    • Fantner GE et al 2006 Components for high speed atomic force microscopy Ultramicroscopy 106 881
    • (2006) Ultramicroscopy , vol.106 , Issue.8-9 , pp. 881
    • Fantner, G.E.1    Al, E.2
  • 4
    • 17044388175 scopus 로고    scopus 로고
    • A mechanical microscope: High-speed atomic force microscopy
    • Humphris ADL, Miles MJ and Hobbs JK 2005 A mechanical microscope: high-speed atomic force microscopy Appl. Phys. Lett. 86 034106
    • (2005) Appl. Phys. Lett. , vol.86 , Issue.3 , pp. 034106
    • Humphris, A.D.L.1    Miles, M.J.2    Hobbs, J.K.3
  • 10
    • 33745857568 scopus 로고    scopus 로고
    • Low-cost multi-touch sensing through frustrated total internal reflection
    • Han J 2005 Low-cost multi-touch sensing through frustrated total internal reflection 18th Ann. ACM Symp. on User Interface Software and Technology (Seattle, WA) (New York: ACM)
    • (2005) 18th Ann. ACM Symp. on User Interface Software and Technology , pp. 115
    • Han, J.1
  • 11
    • 65449125437 scopus 로고    scopus 로고
    • Real-time nanofabrication with high-speed atomic force microscopy
    • Vicary JA and Miles MJ 2009 Real-time nanofabrication with high-speed atomic force microscopy Nanotechnology 20 095302
    • (2009) Nanotechnology , vol.20 , Issue.9 , pp. 095302
    • Vicary, J.A.1    Miles, M.J.2
  • 12
    • 0037439817 scopus 로고    scopus 로고
    • Novel nanosized patterning technology based on electropulsed scanning probe microscopy
    • Brogueira P and Melo LV 2003 Novel nanosized patterning technology based on electropulsed scanning probe microscopy Mater. Sci. Eng. C 23 77
    • (2003) Mater. Sci. Eng. , vol.23 , Issue.1-2 , pp. 77
    • Brogueira, P.1    Melo, L.V.2
  • 13
    • 6144290977 scopus 로고
    • Thermomechanical writing with an atomic force microscope tip
    • Mamin HJ and Rugar D 1992 Thermomechanical writing with an atomic force microscope tip Appl. Phys. Lett. 61 1003-5
    • (1992) Appl. Phys. Lett. , vol.61 , Issue.8 , pp. 1003-1005
    • Mamin, H.J.1    Rugar, D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.