![]() |
Volumn , Issue , 2009, Pages 90-93
|
Research on deep RIE-based through-si-via micromachining for 3-D system-in-package integration
|
Author keywords
Bulk micromachining; Deep reactive ion etching (DRIE); System in package (SiP); Three dimensional integration; Through si via (TSV)
|
Indexed keywords
BULK MICROMACHINING;
DEEP REACTIVE ION ETCHING (DRIE);
SYSTEM-IN-PACKAGE (SIP);
THREE DIMENSIONAL INTEGRATION;
THROUGH-SI-VIA (TSV);
CELLULAR RADIO SYSTEMS;
COMPOSITE MICROMECHANICS;
CONSUMER ELECTRONICS;
ELECTRON BEAM LITHOGRAPHY;
ELECTRONIC EQUIPMENT MANUFACTURE;
EVOLUTIONARY ALGORITHMS;
INTERNET PROTOCOLS;
MICROMACHINING;
MODELS;
SYSTEMS ANALYSIS;
THREE DIMENSIONAL;
REACTIVE ION ETCHING;
|
EID: 70349678323
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/NEMS.2009.5068533 Document Type: Conference Paper |
Times cited : (7)
|
References (6)
|