In-depth resolved Raman scattering analysis of secondary phases in Cu-poor CuInSe2 based thin films

Applied Physics Letters

Volumn 95, Issue 12, 2009, Pages

  Fontan X ^a   Izquierdo Roca, V ^a   Calvo Barrio, L ^a   Lvarez Garcia, J ^b   Prez Rodriguez A ^a,c   Morante, J R ^a,c   Witte, W ^d  

^a UNIVERSITY OF BARCELONA   (Spain)

^b Centre de Recerca i Investigacio de Catalunya CRIC   (Spain)

^c CATALONIA INSTITUTE FOR ENERGY RESEARCH IREC   (Spain)

^d ZENTRUM FÜR SONNENENERGIE UND WASSERSTOFF FORSCHUNG BADEN WÜRTTEMBERG ZSW   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CONTENT RATIO; CU-POOR; CUINSE2; DEPTH-RESOLVED; MICRO-RAMAN SPECTRA; ORDERED VACANCY COMPOUND; RELATIVE INTENSITY; SECONDARY PHASIS;

RAMAN SCATTERING; RAMAN SPECTROSCOPY; SCATTERING;

COPPER COMPOUNDS;

EID: 70349667175     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3236770     Document Type: Article

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