Composition dependence of the Raman A1 mode and additional mode in tetragonal Cu-In-Se thin films

Semiconductor Science and Technology

Volumn 19, Issue 10, 2004, Pages 1201-1206

  Xu, Chuan Ming ^a   Xu, Xiao Liang ^a   Xu, Jun ^a   Yang, Xiao Jie ^a   Zuo, Jian ^a   Kong, Ning ^a   Huang, Wen Hao ^a   Liu, Hong Tu ^a  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; ELECTRON TRANSITIONS; METALLIC FILMS; PHONONS; RAMAN SCATTERING; X RAY DIFFRACTION ANALYSIS;

BOND STRETCHING FORCES; CHALCOPYRITES; DEFECT PHYSICS;

THIN FILMS;

EID: 5544264999     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/19/10/006     Document Type: Article

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