Structure of YSi2 nanowires from scanning tunneling spectroscopy and first principles

Applied Physics Letters

Volumn 95, Issue 12, 2009, Pages

  Iancu, V ^a   Kent, P R C ^b   Zeng, C G ^a   Weitering, H H ^a,b  

^a UNIVERSITY OF TENNESSEE   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CANDIDATE MODELS; FACTOR ANALYSIS; FIRST-PRINCIPLES; IN-PLANE; RELATIVE STABILITIES; SCANNING TUNNELING SPECTROSCOPY; SI(0 0 1); SILICON LATTICES; SURFACE DENSITY; VIA FIRST;

NANOWIRES; SCANNING TUNNELING MICROSCOPY; SPECTROSCOPY; TUNNELING (EXCAVATION); WIND TUNNELS;

ELECTRIC WIRE;

EID: 70349664176     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3236778     Document Type: Article

References (22)

1. M. Sundaram, S. A. Chalmers, P. F. Hopkins, and A. C. Gossard, Science 0036-8075 254, 1326 (1991). 10.1126/science.254.5036.1326
2. C. Zeng, P. R. C. Kent, T. -H. Kim, A. P. Li, and H. H. Weitering, Nature Mater. 1476-1122 7, 539 (2008). 10.1038/nmat2209
3. J. V. Barth, G. Constantini, and K. Kern, Nature (London) 0028-0836 437, 671 (2005). 10.1038/nature04166 (Pubitemid 41486530)
4. K. N. Tu, R. D. Thompson, and B. Y. Tsaur, Appl. Phys. Lett. 0003-6951 38, 626 (1981). 10.1063/1.92457
5. Y. Chen, D. A. A. Ohlberg, M. Medeiro-Ribeiro, Y. A. Chang, and R. S. Williams, Appl. Phys. Lett. 0003-6951 76, 4004 (2000). 10.1063/1.126848
6. C. Preinesberger, S. K. Becker, S. Vandre, T. Kalka, and M. Dahne, J. Appl. Phys. 0021-8979 91, 1695 (2002). 10.1063/1.1430540 (Pubitemid 34148854)
7. B. Z. Liu and J. Nogami, J. Appl. Phys. 0021-8979 93, 593 (2003). 10.1063/1.1516621
8. Y. Chen, D. A. A. Ohlberg, and R. S. Williams, J. Appl. Phys. 0021-8979 91, 3213 (2002). 10.1063/1.1428807 (Pubitemid 34598802)
9. Y. Zhu, W. Zhou, S. Wang, T. Ji, X. Hou, and Q. Cai, J. Appl. Phys. 0021-8979 100, 114312 (2006). 10.1063/1.2398002 (Pubitemid 46012239)
10. B. Z. Liu and J. Nogami, Surf. Sci. 0039-6028 540, 136 (2003). 10.1016/S0039-6028(03)00826-4
11. The expression "thinnest wires" refers to wires that have the smallest widths; all of them are ≈0.4 nm high.
12. G. Binnig, H. Rhorer, Ch. Gerber, and E. Weibel, Phys. Rev. Lett. 0031-9007 50, 120 (1983). 10.1103/PhysRevLett.50.120
13. R. M. Feenstra, J. M. Stroscio, and A. P. Fein, Surf. Sci. 0039-6028 181, 295 (1987). 10.1016/0039-6028(87)90170-1
14. G. Kresse and J. Hafner, Phys. Rev. B 0163-1829 47, 558 (1993) 10.1103/PhysRevB.47.558; G. Kresse and J. Hafner, Phys. Rev. B 0163-1829 49, 14251 (1994). 10.1103/PhysRevB.49.14251
15. P. E. Blöchl, Phys. Rev. B 0163-1829 50, 17953 (1994). 10.1103/PhysRevB.50.17953
16. G. Kresse and J. Joubert, Phys. Rev. B 0163-1829 59, 1758 (1999). 10.1103/PhysRevB.59.1758
17. J. P. Perdew and A. Zunger, Phys. Rev. B 0163-1829 23, 5048 (1981). 10.1103/PhysRevB.23.5048
18. N. Gonzalez Szwacki and B. I. Yakobson, Phys. Rev. B 0163-1829 75, 035406 (2007). 10.1103/PhysRevB.75.035406
19. P. Kim, T. W. Odom, J. Huang, and C. M. Lieber, Phys. Rev. Lett. 0031-9007 82, 1225 (1999). 10.1103/PhysRevLett.82.1225
20. L. Venkataraman and C. M. Lieber, Phys. Rev. Lett. 0031-9007 83, 5334 (1999). 10.1103/PhysRevLett.83.5334
21. J. B. Pendry, J. Phys. C 0022-3719 13, 937 (1980). 10.1088/0022-3719/13/ 5/024
22. The R factor was computed for all the considered structures using a linewidth (half width at half maximum) equal to 0.2 eV.