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Volumn , Issue , 2009, Pages 1342-1348
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Application of wide-band material parameter extraction techniques to printable electronics characterization
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Author keywords
[No Author keywords available]
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Indexed keywords
EXTRACTION METHOD;
FULL-WAVE SIMULATIONS;
MANUFACTURING PROCESS;
MATERIAL CHARACTERIZATIONS;
MATERIAL PARAMETER;
MATERIAL PARAMETER EXTRACTION;
MATERIAL PROPERTY;
PRINTABLE ELECTRONICS;
TEST STRUCTURE;
WIDE-BAND;
PARAMETER EXTRACTION;
EXTRACTION;
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EID: 70349661402
PISSN: 05695503
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ECTC.2009.5074187 Document Type: Conference Paper |
Times cited : (12)
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References (7)
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