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Volumn , Issue , 2009, Pages 1342-1348

Application of wide-band material parameter extraction techniques to printable electronics characterization

Author keywords

[No Author keywords available]

Indexed keywords

EXTRACTION METHOD; FULL-WAVE SIMULATIONS; MANUFACTURING PROCESS; MATERIAL CHARACTERIZATIONS; MATERIAL PARAMETER; MATERIAL PARAMETER EXTRACTION; MATERIAL PROPERTY; PRINTABLE ELECTRONICS; TEST STRUCTURE; WIDE-BAND;

EID: 70349661402     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.2009.5074187     Document Type: Conference Paper
Times cited : (12)

References (7)
  • 2
    • 0035483023 scopus 로고    scopus 로고
    • Accurate transmission line characterisation on high and low-resistivity substrates
    • DOI 10.1049/ip-map:20010675
    • Carchon G., Nauwelaers B., "Accurate transmission line characterisation on high and low-resistivity substrates," IEE Proc. Microwaves, Antennas and Propagation, Vol.148, No.5 (2001), pp. 285-290. (Pubitemid 33093858)
    • (2001) IEE Proceedings: Microwaves, Antennas and Propagation , vol.148 , Issue.5 , pp. 285-290
    • Carchon, G.1    Nauwelaers, B.2
  • 3
    • 31744441107 scopus 로고    scopus 로고
    • De-embedding transmission line measurements for accurate modeling of IC designs
    • Mangan A. M., Voinigescu S. P., Yang M.-T., and Tazlauanu M., "De-embedding transmission line measurements for accurate modeling of IC designs," IEEE Trans. Electron Devices, Vol.53, No.2 (2006), pp. 235- 241.
    • (2006) IEEE Trans. Electron Devices , vol.53 , Issue.2 , pp. 235-241
    • Mangan, A.M.1    Voinigescu, S.P.2    Yang, M.-T.3    Tazlauanu, M.4
  • 4
    • 0018720739 scopus 로고
    • Thru-reflect-line: An improved technique for calibrating the dual six-port automatic network analyzer
    • Engen, G. F., Hoer, C. A., "Thru-Reflect-Line: An Improved Technique for Calibrating the Dual Six-Port Automatic Network Analyzer," IEEE Trans. Microwave Theory and Techniques, Vol.27, No.12 (1979), pp. 987- 993.
    • (1979) IEEE Trans. Microwave Theory and Techniques , vol.27 , Issue.12 , pp. 987-993
    • Engen, G.F.1    Hoer, C.A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.