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Volumn 27, Issue 5, 2009, Pages 2145-2152

Pd/Ru/Au Ohmic contacts to InAlSb/InAs heterostructures for high electron mobility transistors

Author keywords

[No Author keywords available]

Indexed keywords

BEARING REACTION; HETEROSTRUCTURES; THERMAL STABILITY;

CONTACT RESISTANCE; ELECTRIC CONTACTORS; ELECTRON MOBILITY; OHMIC CONTACTS; PALLADIUM; TRANSISTORS; TRANSMISSION ELECTRON MICROSCOPY;

HIGH ELECTRON MOBILITY TRANSISTORS;

EID: 70349653781 PISSN: 10711023 EISSN: None Source Type: Journal
DOI: 10.1116/1.3204983 Document Type: Article

Times cited : (2)

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