SCOPUS 정보 검색 플랫폼

Applied Physics Letters

Volumn 95, Issue 11, 2009, Pages

Variation of leakage current mechanisms by ion substitution in BiFeO 3 thin films

(2) Zhong, Zhiyong a Ishiwara, Hiroshi a

a Tokyo Institute of Technology ^* (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BFO FILMS; CHEMICAL SOLUTION DEPOSITION; CRYSTALLIZATION TEMPERATURE; DENSITY OF TRAP STATE; ION SUBSTITUTION; OHMIC CONDUCTION; POOLE-FRENKEL EMISSION; SPACE-CHARGE-LIMITED; TRANSIENT EFFECT;

MANGANESE; MANGANESE COMPOUNDS; SEMICONDUCTING BISMUTH COMPOUNDS;

LEAKAGE CURRENTS;

EID: 70349488343 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3231073 Document Type: Article

Times cited : (97)

References (18)

1
- 16544385345
- 1476-1122,. 10.1038/nmat1265
- C. Ederer and N. A. Spaldin, Nature Mater. 1476-1122 3, 849 (2004). 10.1038/nmat1265
- (2004) Nature Mater. , vol.3 , pp. 849
- Ederer, C.¹ Spaldin, N.A.²

2
- 33747623307
- Multiferroic and magnetoelectric materials
- DOI 10.1038/nature05023, PII NATURE05023
- W. Eerenstein, N. D. Mathur, and J. F. Scott, Nature 442, 759 (2006). 10.1038/nature05023 (Pubitemid 44261898)
- (2006) Nature , vol.442 , Issue.7104 , pp. 759-765
- Eerenstein, W.¹ Mathur, N.D.² Scott, J.F.³

3
- 54249091629
- 0021-4922,. 10.1143/JJAP.47.2230
- Z. Y. Zhong, S. K. Singh, K. Maruyama, and H. Ishiwara, Jpn. J. Appl. Phys. 0021-4922 47, 2230 (2008). 10.1143/JJAP.47.2230
- (2008) Jpn. J. Appl. Phys. , vol.47 , pp. 2230
- Zhong, Z.Y.¹ Singh, S.K.² Maruyama, K.³ Ishiwara, H.⁴

4
- 15444365837
- 3
- DOI 10.1103/PhysRevB.71.014113, 014113
- J. B. Neaton, C. Ederer, U. V. Waghmare, N. A. Spaldin, and K. M. Rabe, Phys. Rev. B 0163-1829 71, 014113 (2005). 10.1103/PhysRevB.71.014113 (Pubitemid 40486273)
- (2005) Physical Review B - Condensed Matter and Materials Physics , vol.71 , Issue.1 , pp. 0141131-0141138
- Neaton, J.B.¹ Ederer, C.² Waghmare, U.V.³ Spaldin, N.A.⁴ Rabe, K.M.⁵

5
- 82455176208
- 0038-5670,. 10.1070/PU1982v025n07ABEH004570
- G. A. Smolenskii and I. Chupis, Sov. Phys. Usp. 0038-5670 25, 475 (1982). 10.1070/PU1982v025n07ABEH004570
- (1982) Sov. Phys. Usp. , vol.25 , pp. 475
- Smolenskii, G.A.¹ Chupis, I.²

6
- 33847123580
- Leakage mechanisms in BiFe O3 thin films
- DOI 10.1063/1.2535663
- G. W. Pabst, L. W. Martin, Y. Chu, and R. Ramesh, Appl. Phys. Lett. 0003-6951 90, 072902 (2007). 10.1063/1.2535663 (Pubitemid 46280706)
- (2007) Applied Physics Letters , vol.90 , Issue.7 , pp. 072902
- Pabst, G.W.¹ Martin, L.W.² Chu, Y.-H.³ Ramesh, R.⁴

7
- 34548066514
- Temperature-dependent leakage mechanisms of PtBiFe O3 SrRu O3 thin film capacitors
- DOI 10.1063/1.2772666
- H. Yang, M. Jain, N. A. Suvorova, H. Zhou, H. M. Luo, D. M. Feldmann, P. C. Dowden, R. F. DePaula, S. R. Foltyn, and Q. X. Jia, Appl. Phys. Lett. 0003-6951 91, 072911 (2007). 10.1063/1.2772666 (Pubitemid 47287649)
- (2007) Applied Physics Letters , vol.91 , Issue.7 , pp. 072911
- Yang, H.¹ Jain, M.² Suvorova, N.A.³ Zhou, H.⁴ Luo, H.M.⁵ Feldmann, D.M.⁶ Dowden, P.C.⁷ Depaula, R.F.⁸ Foltyn, S.R.⁹ Jia, Q.X.¹⁰

8
- 0001521966
- 0096-8250,. 10.1103/PhysRev.133.A1431
- C. J. Kevane, Phys. Rev. 0096-8250 133, A1431 (1964). 10.1103/PhysRev.133.A1431
- (1964) Phys. Rev. , vol.133 , pp. 1431
- Kevane, C.J.¹

9
- 58349097966
- 0003-6951,. 10.1063/1.3070532
- S. J. Clark and J. Robertson, Appl. Phys. Lett. 0003-6951 94, 022902 (2009). 10.1063/1.3070532
- (2009) Appl. Phys. Lett. , vol.94 , pp. 022902
- Clark, S.J.¹ Robertson, J.²

10
- 34047129665
- 3
- DOI 10.1063/1.2716868
- S. J. Clark and J. Robertson, Appl. Phys. Lett. 0003-6951 90, 132903 (2007). 10.1063/1.2716868 (Pubitemid 46516893)
- (2007) Applied Physics Letters , vol.90 , Issue.13 , pp. 132903
- Clark, S.J.¹ Robertson, J.²

11
- 33748492120
- 3 nanowires
- DOI 10.1063/1.2345825
- F. Gao, Y. Yuan, X. Y. Chen, F. Chen, J. M. Liu, and Z. F. Ren, Appl. Phys. Lett. 0003-6951 89, 102506 (2006). 10.1063/1.2345825 (Pubitemid 44359629)
- (2006) Applied Physics Letters , vol.89 , Issue.10 , pp. 102506
- Gao, F.¹ Yuan, Y.² Wang, K.F.³ Chen, X.Y.⁴ Chen, F.⁵ Liu, J.-M.⁶ Ren, Z.F.⁷

12
- 70349523263
- Poster Presentation at the ICMR Summer School on Multiferroics and Beyond, Santa Barbara, CA, (unpublished).
- L. Palova, K. M. Rabe, and P. Chandra, Poster Presentation at the ICMR Summer School on Multiferroics and Beyond, Santa Barbara, CA, 2008 (unpublished).
- (2008)
- Palova, L.¹ Rabe, K.M.² Chandra, P.³

13
- 0004005306
- 2nd ed. (Wiley, New York).
- S. M. Sze, Physics of Semiconductor Device, 2nd ed. (Wiley, New York, 1981).
- (1981) Physics of Semiconductor Device
- Sze, S.M.¹

14
- 36149023551
- 0096-8250,. 10.1103/PhysRev.103.1648
- M. A. Lampert, Phys. Rev. 0096-8250 103, 1648 (1956). 10.1103/PhysRev.103.1648
- (1956) Phys. Rev. , vol.103 , pp. 1648
- Lampert, M.A.¹

15
- 33745625140
- 3 thin films deposited on Pt electrodes using chemical solution deposition
- DOI 10.1063/1.2218819
- S. K. Singh, K. Maruyama, and H. Ishiwara, Appl. Phys. Lett. 0003-6951 88, 262908 (2006). 10.1063/1.2218819 (Pubitemid 43992965)
- (2006) Applied Physics Letters , vol.88 , Issue.26 , pp. 262908
- Singh, S.K.¹ Ishiwara, H.² Maruyama, K.³

16
- 36149017207
- 0096-8250,. 10.1103/PhysRev.97.1538
- A. Rose, Phys. Rev. 0096-8250 97, 1538 (1955). 10.1103/PhysRev.97.1538
- (1955) Phys. Rev. , vol.97 , pp. 1538
- Rose, A.¹

17
- 0000665290
- J. Frenkel, Tech. Phys. USSR 5, 685 (1938).
- (1938) Tech. Phys. USSR , vol.5 , pp. 685
- Frenkel, J.¹

18
- 18844441261
- 0021-8979,. 10.1063/1.1881776
- S. Iakovlev, C. H. Solterbeck, M. Kuhnke, and M. Es-Souni, J. Appl. Phys. 0021-8979 97, 094901 (2005). 10.1063/1.1881776
- (2005) J. Appl. Phys. , vol.97 , pp. 094901
- Iakovlev, S.¹ Solterbeck, C.H.² Kuhnke, M.³ Es-Souni, M.⁴

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.