Energy loss of 132Xe-ions in thin foils

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 267, Issue 20, 2009, Pages 3403-3408

  Trzaska, W H ^a,b   Knyazheva, G N ^c   Perkowski, J ^d   Andrzejewski, J ^d   Khlebnikov, S V ^a,e   Kozulin, E M ^c   Lyapin, V G ^b   Malkiewicz, T ^a   Mutterer, M ^f  

^a UNIVERSITY OF JYVÄSKYLÄ   (Finland)

^b HELSINKI INSTITUTE OF PHYSICS   (Finland)

^c JOINT INSTITUTE FOR NUCLEAR RESEARCH   (Russian Federation)

^d UNIVERSITY OF LODZ   (Poland)

^e KHLOPIN RADIUM INSTITUTE   (Russian Federation)

^f DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

132Xe ions; Au, Ni, C, Al, Lu, Pb, Th targets; dE dx; Microchannel plate (MCP); Pulse height defect; S; Stopping force; Stopping power; Time of flight (TOF)

Indexed keywords

132XE-IONS; AU, NI, C, AL, LU, PB, TH TARGETS; DE/DX; MICROCHANNEL PLATE (MCP); PULSE HEIGHT DEFECT; S; STOPPING FORCE; STOPPING POWER; TIME OF FLIGHT (TOF);

ALUMINUM; ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY DISSIPATION; FORECASTING; IONIZATION; IONS; LEAD; MICROCHANNELS; NICKEL; PARTICLE DETECTORS; POSITION CONTROL; XENON;

IMAGE STORAGE TUBES;

EID: 70349487874     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2009.08.006     Document Type: Article

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