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Volumn 195, Issue 1-2, 2002, Pages 147-165
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New approach to energy loss measurements
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Author keywords
16O; 1H; 40Ar; 4He; Alpha particles; Au; C; dE dx; Heavy ions; Microchannel plate (MCP); Ni; Protons; Pulse height defect; S; Stopping force; Stopping power; Time of flight (TOF)
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Indexed keywords
DEFECTS;
ERROR ANALYSIS;
HEAVY IONS;
PROTONS;
MICROCHANNEL PLATES (MCP);
ELECTRON ENERGY LEVELS;
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EID: 0036783889
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(02)01255-7 Document Type: Article |
Times cited : (49)
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References (21)
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