Spectroscopic studies of (AsSe) 100-x Ag x thin films

Applied Surface Science

Volumn 255, Issue 24, 2009, Pages 9691-9694

  Ilcheva, V ^a   Petkova, T ^a   Petkov, P ^b   Boev, V ^a   Socol, G ^c   Sima, F ^c   Ristoscu, C ^c   Mihailescu, C N ^c   Mihailescu, I N ^c   Popov, C ^d   Reithmaier, J P ^d  

^a BULGARIAN ACADEMY OF SCIENCES   (Bulgaria)

^b UNIVERSITY OF CHEMICAL TECHNOLOGY AND METALLURGY   (Bulgaria)

^c NATIONAL INSTITUTE FOR LASER   (Romania)

^d UNIVERSITY OF KASSEL   (Germany)

Author keywords

Chalcogenide glass thin films; Optical absorption; Optical band gap

Indexed keywords

ELECTRONIC STRUCTURE; ENERGY GAP; GLASS; LIGHT ABSORPTION; OPTICAL BAND GAPS; PULSED LASER DEPOSITION; REFRACTIVE INDEX; SILVER; SPECTROSCOPIC ANALYSIS; THERMAL EVAPORATION; THIN FILMS; VACUUM EVAPORATION; X RAY DIFFRACTION;

AMORPHOUS CHARACTERS; CHALCOGENIDE GLASS; GLASSY MATRICES; QUARTZ SUBSTRATE; SPECTROSCOPIC STUDIES; VACUUM THERMAL EVAPORATION; WAVELENGTH RANGES; X-RAY DIFFRACTION INVESTIGATIONS;

OPTICAL FILMS;

EID: 70349472804     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2009.04.055     Document Type: Article

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