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Volumn 6, Issue 4, 2009, Pages 810-812
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Growth of 3C-SiC nanowires on nickel coated Si(100) substrate using dichloromethylvinylsilane and diethylmethylsilane by MOCVD method
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS CARBON LAYER;
CRYSTALLIZED STRUCTURE;
CUBIC SILICON CARBIDE;
DIETHYLMETHYLSILANE;
EDX ANALYSIS;
ELECTRONIC DEVICE;
FIELD EMITTER;
GROWTH DIRECTIONS;
METALORGANIC CHEMICAL VAPOR DEPOSITION;
MOCVD METHODS;
NICKEL COATED;
SI (100) SUBSTRATE;
SIC NANOWIRE;
SINGLE PRECURSORS;
SINGLE-SOURCE PRECURSOR;
TEM ANALYSIS;
XPS;
XRD PATTERNS;
AMORPHOUS CARBON;
ELECTRIC WIRE;
EPITAXIAL GROWTH;
METALLORGANIC CHEMICAL VAPOR DEPOSITION;
NANOWIRES;
NICKEL ALLOYS;
ORGANIC CHEMICALS;
SEMICONDUCTOR GROWTH;
SEMICONDUCTOR QUANTUM DOTS;
SILICON;
SILICON CARBIDE;
SUBSTRATES;
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EID: 70349434010
PISSN: 18626351
EISSN: None
Source Type: Journal
DOI: 10.1002/pssc.200880621 Document Type: Conference Paper |
Times cited : (8)
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References (9)
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