A study of the grain size and electric properties of Mn-doped ZnO thin films grown by plasma-assisted molecular beam epitaxy

Physica Status Solidi (C) Current Topics in Solid State Physics

Volumn 6, Issue 6, 2009, Pages 1468-1471

  Lin, Hung Ji ^a   Lin, Der Yuh ^a   Hong, Jia Zheng ^a   Yang, Chu Shou ^b   Lin, Chih Ming ^c   Lin, Chia Feng ^d  

^a NATIONAL CHANGHUA UNIVERSITY OF EDUCATION   (Taiwan)

^b TATUNG UNIVERSITY   (Taiwan)

^c NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^d NATIONAL CHUNG HSING UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

C-SAPPHIRE; ELECTRICAL PROPERTY; GRAIN INTERIORS; GRAIN SIZE; HALL MEASUREMENTS; IMPEDANCE SPECTROSCOPY; IMPURITY SCATTERING; MN-DOPED ZNO; MN-DOPING; PLASMA-ASSISTED MOLECULAR BEAM EPITAXY; RAMAN SPECTRA; ZNO FILMS;

ACTIVATION ENERGY; ATOMIC FORCE MICROSCOPY; CARRIER CONCENTRATION; CORUNDUM; CRYSTAL GROWTH; GALVANOMAGNETIC EFFECTS; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; HALL MOBILITY; MANGANESE; MANGANESE COMPOUNDS; METALLIC FILMS; MOLECULAR BEAM EPITAXY; MOLECULAR BEAMS; PLASMAS; RAMAN SPECTROSCOPY; SEMICONDUCTING ZINC COMPOUNDS; SEMICONDUCTOR DOPING; SEMICONDUCTOR QUANTUM WIRES; ZINC; ZINC OXIDE;

ELECTRIC PROPERTIES;

EID: 70349431438     PISSN: 18626351     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssc.200881514     Document Type: Conference Paper

References (16)

1. M. Caglar, Y. Caglar, and S. Ilican, Phys. Status Solidi C 4, 1337 (2007).
2. T. Fukumura, Zhengwu Jin, A. Ohtomo, H. Koinuma, and M. Kawasaki, Appl. Phys. Lett. 75, 3366 (1999).
3. T. Dietl, H. Ohno, F. Matsukura, J. Cibert, and D. Ferrand, Science 287, 1019 (2000).
4. T. Fukumura, Zhengwu Jin, and M. Kawasaki, Appl. Phys. Lett. 78, 958 (2001).
5. H. J. Lin, D. Y. Lin, J. S. Wu, W. C. Chou, C. S. Yang, J. S. Wang, and W. H. Lo, J. Kor. Phys. Soc. 53, 98 (2008).
6. J. Gleize, E. Chikoidze, Y. Dumont, E. Rzepka, and O. Gorochov, Superlattices Microstruct. 42, 242 (2007).
7. M. Jouanne, J. F. Morhange, W. Szuszkiewicz, Z. Gołacki, and A. Mycielski, Phys. Status Solidi C 3, 1205 (2006).
8. H. K. Yadav, K. Sreenivas, R. S. Katiyar, and V. Gupta, J. Phys. D: Appl. Phys. 40, 6005 (2007).
9. L. W. Yang, X. L. Wu, G. S. Huang, T. Qiu, and Y. M. Yang, J. Appl. Phys. 97, 014308 (2005).
10. C. L. Du, Z. B. Gu, M. H. Lu, J. Wang, S. T. Zhang, J. Zhao, G. X. Cheng, H. Heng, and Y. F. Chen, J. Appl. Phys. 99, 123515 (2006).
11. S. B. Zhang, S. H. Wei, and A. Zunger, Phys. Rev. B 63, 075205 (2001).
12. J. Han, P. Q. Mantas, and A. M. R. Senos, J. Eur. Ceram. Soc. 22, 49 (2002).
13. E. Barsoukov and J. R. Macdonald, Impedance Spectroscopy: Theory, Experiment, and Applications (Wiley-Interscience, New Jersey, 2005), p. 208.
14. C. Tian and S. W. Chan, J. Am. Ceram. Soc. 85, 2222 (2002).
15. J. Lee, J. H. Hwang, J. J. Mashek, T. O. Mason, A. E. Miller, and R. W. Siegel, J. Mater. Res. 10, 2295 (1995).
16. Y. Hwang, Y. Um, and S. Cho, J. Kor. Phys. Soc. 53, 392 (2008).