Cryo crystal structure determination and application to intermediates

Chemical Society Reviews

Volumn 27, Issue 3, 1998, Pages 171-178

  Stalke, Dietmar ^a  

^a UNIVERSITY OF WÜRZBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0032341686     PISSN: 03060012     EISSN: None     Source Type: Journal    
DOI: 10.1039/a827171z     Document Type: Article

References (9)

1. (a) R. Rudman, Low Temperature X-Ray Diffraction: Apparatus and Techniques, Plenum, New York, 1976;
2. (b) M. Veith and W. Frank, Chem. Rev., 1988, 88, 81.
3. For a review see: E. F. Garman and T. R. Schneider, J. Appl. Crystallogr., 1997, 30, 211 and references therein.
4. H. D. Bellamy, R. P Phizackerley, S. M. Soltis and H. Hope, J. Appl. Crystallogr., 1994, 27, 967 and references therein
5. M. Veith and H. Bärnighausen, Acta Crystallogr. Sect. B, 1974, 30, 1806.
6. D. Seebach, R. Amstutz, T. Laube, W. B. Schweizer and J. D. Dunitz, J. Am. Chem. Soc., 1985, 107, 5403.
7. R. Boese and D. Bläser, J. Appl. Crystallogr., 1989, 22, 394.
8. See for example: A. Simon, W. Brämer, B. Hillenkötter and H.-J. Kullmann, Z. Anorg. Allg. Chem., 1976, 419, 253.
9. D. Brodalla, D. Mootz, R. Boese and W. Osswald, J. Appl. Crystallogr., 1985, 18, 316.