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Volumn , Issue , 2009, Pages

A 1.1V 50mW 2.5GS/s 7b time-interleaved C-2C SAR ADC in 45nm LP digital CMOS

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EID: 70349289826     PISSN: 01936530     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISSCC.2009.4977315     Document Type: Conference Paper
Times cited : (124)

References (4)
  • 1
    • 49549115760 scopus 로고    scopus 로고
    • A 24GS/s 6b ADC in 90nm CMOS
    • Feb.
    • P. Schvan, et al., "A 24GS/s 6b ADC in 90nm CMOS," ISSCC Dig. Tech. Papers, pp. 544-545, Feb. 2008.
    • (2008) ISSCC Dig. Tech. Papers , pp. 544-545
    • Schvan, P.1
  • 2
    • 33847125767 scopus 로고    scopus 로고
    • A 0.5mm2 integrated capacitive vibration sensor with Sub-10 zF/rt- Hz noise floor
    • Sept.
    • S. V. Iyer et al., "A 0.5mm2 Integrated Capacitive Vibration Sensor with Sub-10 zF/rt- Hz Noise Floor," IEEE Custom Integrated Circuits Conf., pp. 93-96, Sept. 2005.
    • (2005) IEEE Custom Integrated Circuits Conf. , pp. 93-96
    • Iyer, S.V.1
  • 3
    • 33845655208 scopus 로고    scopus 로고
    • A 6-bit 600-MS/s 5.3-mW asynchronous ADC in 0.13-μ m CMOS
    • Dec.
    • S. M. Chen and R. W. Brodersen, "A 6-bit 600-MS/s 5.3-mW Asynchronous ADC in 0.13-μ m CMOS," IEEE J. Solid-State Circuits, vol.41, no.12, pp. 2669-2680, Dec. 2006.
    • (2006) IEEE J. Solid-State Circuits , vol.41 , Issue.12 , pp. 2669-2680
    • Chen, S.M.1    Brodersen, R.W.2
  • 4
    • 4644225364 scopus 로고    scopus 로고
    • Calibration of sample-time error in a two-channel time-interleaved analog-to-digital converter
    • Jan.
    • S. M. Jamal, et al., "Calibration of Sample-Time Error in a Two-Channel Time- Interleaved Analog-to-Digital Converter," IEEE Trans. Circuits and Systems-I, vol.51, no.1, pp. 130-139, Jan. 2004.
    • (2004) IEEE Trans. Circuits and Systems-I , vol.51 , Issue.1 , pp. 130-139
    • Jamal, S.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.