Lie group framework of iterative closest point algorithm for n-D data registration

International Journal of Pattern Recognition and Artificial Intelligence

Volumn 23, Issue 6, 2009, Pages 1201-1220

  Ying, Shihui ^a,b   Peng, Jigen ^b   Du, Shaoyi ^b   Qiao, Hong ^c  

^a SHANGHAI UNIVERSITY   (China)

^b XI'AN JIAOTONG UNIVERSITY   (China)

^c INSTITUTE OF AUTOMATION   (China)

Author keywords

ICP; Initial parameters; Iterative linear systems; Lie group; Registration

Indexed keywords

ICP; INITIAL PARAMETERS; ITERATIVE LINEAR SYSTEMS; LIE GROUP; REGISTRATION;

ALGORITHMS; LINEAR SYSTEMS; MATHEMATICAL MODELS;

INDUCTIVELY COUPLED PLASMA;

EID: 70349269742     PISSN: 02180014     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218001409007533     Document Type: Article

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