Planar photonic crystal microspectrometers in silicon-nitride for the visible range

Optics Express

Volumn 17, Issue 19, 2009, Pages 17060-17069

  Momeni, Babak ^a   Hosseini, Ehsan Shah ^a   Adibi, Ali ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

NITRIDES; PHOTONIC CRYSTALS; REFRACTION; SILICON NITRIDE; SPECTROMETERS;

EXPERIMENTAL DEMONSTRATIONS; HIGH-WAVELENGTH RESOLUTION; INTEGRATED SPECTROMETERS; NEGATIVE REFRACTION EFFECTS; PLANAR PHOTONIC CRYSTAL; PLANAR PHOTONIC CRYSTAL STRUCTURE; VISIBLE-WAVELENGTH RANGE; WAVELENGTH RESOLUTION;

CRYSTAL STRUCTURE;

EID: 70349196373     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.17.017060     Document Type: Article

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