Determining the elastic modulus of thin films using a buckling-based method: Computational study

Journal of Physics D: Applied Physics

Volumn 42, Issue 17, 2009, Pages

  Zheng, Xiu Peng ^a   Cao, Yan Ping ^a   Li, Bo ^a   Feng, Xi Qiao ^a   Jiang, Hanqing ^b   Huang, Yonggang Y ^c  

^a TSINGHUA UNIVERSITY   (China)

^b Arizona State University   (United States)

^c Northwestern University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BUCKLING MODE; COMPLIANT SUBSTRATES; COMPUTATIONAL RESULTS; COMPUTATIONAL STUDIES; DIMENSIONAL ANALYSIS; EFFECT OF POISSON'S RATIO; FINITE WIDTH; FUNDAMENTAL SOLUTIONS; MATERIAL PARAMETER; MATERIAL PROPERTY; NON-LINEAR FINITE ELEMENTS; NORMAL STRESS; PLANE STRAIN PROBLEM; POISSON'S RATIO; PRACTICAL USE; SIMPLE EXPRESSION; SOFT SUBSTRATES; THICKNESS OF THE FILM; WIDTH THICKNESS RATIO; YOUNG'S MODULUS;

BUCKLING; ELASTIC MODULI; ELASTICITY; ELECTRIC WIRE; POISSON DISTRIBUTION; POISSON EQUATION; SUBSTRATES; THIN FILMS;

POISSON RATIO;

EID: 70149112512     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/42/17/175506     Document Type: Article

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