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Volumn 42, Issue 14, 2009, Pages
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Optoelectronic properties of CuPc thin films deposited at different substrate temperatures
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Author keywords
[No Author keywords available]
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Indexed keywords
COPPER PHTHALOCYANINE;
CRYSTAL PHASE;
DIFFERENT SUBSTRATES;
ELECTROOPTICAL RESPONSE;
EXTERNAL QUANTUM EFFICIENCY;
GRAIN SIZE;
OPTICAL ABSORPTION COEFFICIENTS;
OPTICAL CHARACTERIZATION;
OPTICAL TRANSMITTANCE;
OPTOELECTRONIC PROPERTIES;
PHOTOTHERMAL DEFLECTION SPECTROSCOPY;
SCHOTTKY;
SUBSTRATE TEMPERATURE;
X RAY DIFFRACTOMETRY;
X-RAY DIFFRACTION SPECTROSCOPY;
ATOMIC FORCE MICROSCOPY;
ATOMIC SPECTROSCOPY;
DIFFRACTION;
SUBSTRATES;
THIN FILMS;
X RAY DIFFRACTION;
X RAY DIFFRACTION ANALYSIS;
ABSORPTION SPECTROSCOPY;
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EID: 70149103545
PISSN: 00223727
EISSN: 13616463
Source Type: Journal
DOI: 10.1088/0022-3727/42/14/145102 Document Type: Article |
Times cited : (45)
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References (20)
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