Surface morphology characterisation of Sn-doped ZnO films for antireflective coating

Materials Research Innovations

Volumn 13, Issue 3, 2009, Pages 157-160

  Ariyanto, N P ^a   Abdullah, H ^a   Ghani, N S A ^a  

^a UNIVERSITI KEBANGSAAN MALAYSIA   (Malaysia)

Author keywords

Electron beam evaporation; Sn doped ZnO; Thin film

Indexed keywords

ANTI REFLECTIVE COATINGS; AS-DEPOSITED FILMS; CHARACTERISATION; DOPANT ADDITIONS; DOPANT CONCENTRATIONS; DOPED FILMS; DOPED SAMPLE; ELECTRON BEAM EVAPORATION; ELECTRON BEAM EVAPORATION METHODS; HEXAGONAL CRYSTAL STRUCTURE; SEM; SMALL PARTICLES; SN-DOPED; SN-DOPED ZNO; UNDOPED FILMS; ZNO;

AGGLOMERATION; ATOMIC FORCE MICROSCOPY; COATINGS; CRYSTAL STRUCTURE; ELECTRON BEAMS; ELECTRONS; EVAPORATION; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING ZINC COMPOUNDS; SEMICONDUCTOR DOPING; SURFACE MORPHOLOGY; SURFACE PROPERTIES; SURFACE ROUGHNESS; THIN FILM DEVICES; THIN FILMS; VAPORS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE;

TIN;

EID: 70149094581     PISSN: 14328917     EISSN: None     Source Type: Journal    
DOI: 10.1179/143307509X437491     Document Type: Conference Paper

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