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Volumn 93, Issue 11, 2009, Pages 1986-1993

Investigation of unusual shunting behavior due to phototransistor effect in n-type aluminum-alloyed rear junction solar cells

Author keywords

Aluminum alloyed rear junction; Laser doping; N type silicon solar cells; Phototransistors; Schottky contacts; Shunting effect

Indexed keywords

CELL STRUCTURE; COMMERCIAL PRODUCTIONS; DARK CONDITIONS; FILL FACTOR; HIGH EFFICIENCY; LASER DOPING; N TYPE SILICON; N-TYPE SILICON SOLAR CELLS; P-TYPE SILICON WAFERS; SCHOTTKY CONTACTS; SCREEN-PRINTED; SELECTIVE EMITTERS; SHUNTING EFFECT;

EID: 69949179588     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2009.07.018     Document Type: Article
Times cited : (12)

References (13)
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    • Schmiga, C.1    Nagel, H.2    Schmidt, J.3
  • 5
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    • Self aligning method for forming a selective emitter and metallization in a solar cell,
    • US Patent Application /6429037
    • S.R. Wenham, M.A. Green, Self aligning method for forming a selective emitter and metallization in a solar cell, US Patent Application 2002/6429037.
    • (2002)
    • Wenham, S.R.1    Green, M.A.2
  • 8
    • 69949119370 scopus 로고
    • Method of plating by means of light,
    • US Patent Application /4144139
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    • (1979)
    • Durkee, F.L.1
  • 9
    • 67249152470 scopus 로고    scopus 로고
    • Impact of laser-induced defects on the performance of solar cells using localized laser-doped regions beneath the metal contacts
    • October, Milan, Italy, pp
    • A. Sugianto, B.S. Tjahjono, J.H. Guo, S.R. Wenham, Impact of laser-induced defects on the performance of solar cells using localized laser-doped regions beneath the metal contacts, in: Proceedings of the 22nd European Photovoltaic Solar Energy Conference, 22-26 October 2007, Milan, Italy, pp. 1759-1762.
    • (2007) Proceedings of the 22nd European Photovoltaic Solar Energy Conference, 22-26 , pp. 1759-1762
    • Sugianto, A.1    Tjahjono, B.S.2    Guo, J.H.3    Wenham, S.R.4
  • 11
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    • A.G Aberle, S.R. Wenham, M.A. Green, A new method for accurate measurements of the lumped series resistance of solar cells, in: Conference Record of the 23rd IEEE Photovoltaic Specialists Conference, May 1993, Louisville, KY, USA, pp. 133-139.
    • A.G Aberle, S.R. Wenham, M.A. Green, A new method for accurate measurements of the lumped series resistance of solar cells, in: Conference Record of the 23rd IEEE Photovoltaic Specialists Conference, May 1993, Louisville, KY, USA, pp. 133-139.
  • 12
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    • Thermal and electrical effects caused by outdoor hot-spot testing in associations of photovoltaic cells
    • Garcia M.C.A., Herrmann W., Bömer W., and Proisy B. Thermal and electrical effects caused by outdoor hot-spot testing in associations of photovoltaic cells. Prog. Photovolt. Res. Appl. 11 (2003) 293-307
    • (2003) Prog. Photovolt. Res. Appl. , vol.11 , pp. 293-307
    • Garcia, M.C.A.1    Herrmann, W.2    Bömer, W.3    Proisy, B.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.