Unusual lock-in thermography signals: Schottky-type grid contacts, peltier effects, and thermal wave interference

Conference Record of the 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion, WCPEC-4

Volumn 1, Issue , 2006, Pages 912-915

  Breitenstein, O ^a   Rakotoniaina, J P ^a  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

LEAKAGE CURRENTS; PELTIER EFFECT; SCHOTTKY BARRIER DIODES; WAVE INTERFERENCE;

THERMAL WAVE INTERFERENCE; THERMOGRAPHY SIGNALS;

THERMOGRAPHY (IMAGING);

EID: 41749085500     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/WCPEC.2006.279604     Document Type: Conference Paper

References (4)

1. O. Breitenstein, M. Langenkamp, "Lock-in Thermography - Basics and Use for Functional Diagnostics of Electronic Components", Springer (Heidelberg) 2003.
2. O. Breitenstein, J.P. Rakotoniaina, G. Hahn, M. Kaes, T. Pernau, S. Seren, W. Warta, J. Isenberg, "Lock-in Thermography - A Universal Tool for Local Analysis of Solar Cells", Proc. 20th European Photovoltaic Solar Energy Conference and Exhibition, Barcelona, 6-10 June 2005, pp. 590-593
3. O. Breitenstein, J.P. Rakotoniaina, A.S.H. van der Heide, J. Carstensen, "Series Resistance Imaging in Solar Cells by Lock-in Thermography", Progr. Photovolt.: Res. Appl. 13(2005)645-660.
4. S. Keller, W. Neu, P. Fath, E. Bucher, "Quantitative Comparison of Different Geometries for HighVo Solar cells", Proc. 17th Eur. PVSEC, Munich 2001, pp. 1735-1738.