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Volumn 30, Issue 9, 2009, Pages 901-903

AlGaN/GaN HEMT with integrated recessed schottky-drain protection diode

Author keywords

AlGaN GaN high electron mobility transistor (HEMT); Protection diode; Recessed Schottky drain diode

Indexed keywords

ALGAN/GAN; ALGAN/GAN HEMTS; ALGAN/GAN HIGH-ELECTRON MOBILITY TRANSISTOR (HEMT); DEVICE SIMULATIONS; ELECTRONIC MECHANISMS; HIGH ROBUSTNESS; ON-STATE RESISTANCE; PROTECTION DIODE; PROTECTION DIODES; RECESSED SCHOTTKY-DRAIN DIODE; REVERSE BLOCKING; REVERSE BLOCKING CAPABILITY; SCHOTTKY; TRANSISTOR CHANNELS;

EID: 69949171987     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2009.2026437     Document Type: Article
Times cited : (47)

References (6)
  • 2
    • 57349195559 scopus 로고    scopus 로고
    • Switch-mode amplifier ICs with over 90% efficiency for class-S PAs using GaAs-HBTs and GaN-HEMTs
    • C. Meliani, J. Flucke, A. Wentzel, J. Würfl, W. Heinrich, and G. Tränkle, "Switch-mode amplifier ICs with over 90% efficiency for class-S PAs using GaAs-HBTs and GaN-HEMTs," in Proc. MTTS, 2008, pp. 751-754.
    • (2008) Proc. MTTS , pp. 751-754
    • Meliani, C.1    Flucke, J.2    Wentzel, A.3    Würfl, J.4    Heinrich, W.5    Tränkle, G.6
  • 3
    • 64549163189 scopus 로고    scopus 로고
    • Monolithic integration of lateral field-effect rectifier with normally-off HEMT for GaN-on-Si switchmode power supply converters
    • San Francisco, CA, Dec. 15-17
    • W. Chen, K.-Y. Wong, and K. J. Chen, "Monolithic integration of lateral field-effect rectifier with normally-off HEMT for GaN-on-Si switchmode power supply converters," in IEDM Tech. Dig., San Francisco, CA, Dec. 15-17, 2008, pp. 1-4.
    • (2008) IEDM Tech. Dig , pp. 1-4
    • Chen, W.1    Wong, K.-Y.2    Chen, K.J.3
  • 5
    • 57249090864 scopus 로고    scopus 로고
    • Punchthrough-voltage enhancement of AlGaN/GaN HEMTs using Al-GaN double-heterojunction confinement
    • Dec
    • E. Bahat-Treidel, O. Hilt, F. Brunner, J. Wurfl, and G. Trankle, "Punchthrough-voltage enhancement of AlGaN/GaN HEMTs using Al-GaN double-heterojunction confinement," IEEE Trans. Electron Devices, vol. 55, no. 12, pp. 3354-3359, Dec. 2008.
    • (2008) IEEE Trans. Electron Devices , vol.55 , Issue.12 , pp. 3354-3359
    • Bahat-Treidel, E.1    Hilt, O.2    Brunner, F.3    Wurfl, J.4    Trankle, G.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.