Techniques for consecutive TEM and Atom probe tomography analysis of nanowires

Microscopy and Microanalysis

Volumn 15, Issue SUPPL. 2, 2009, Pages 254-255

  Diercks, D R ^a   Gorman, B P ^b   Cheung, C L ^c   Wang, G ^c  

^a UNIVERSITY OF NORTH TEXAS   (United States)

^b Department of Metallurgical and Materials Engineering   (United States)

^c UNIVERSITY OF NEBRASKA LINCOLN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 69949171091     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927609093398     Document Type: Article

References (5)

1. M. S. Gudiksen et al., Nature, 415, (2002) 617.
2. C. J. Lee et al., Appl. Phys. Lett., 81 (2002) 3648.
3. D. E. Perea et al., Nano Lett., 6 (2006) 181.
4. T. J. Prosa et al., Microsc. Microanal., 14(Suppl 2), (2008) 456.
5. B. P. Gorman et al., Microsc. Today, 16 (2008) 42.