Specimen preparation for cross-section atom probe analysis

Microscopy and Microanalysis

Volumn 14, Issue SUPPL. 2, 2008, Pages 1004-1005

  Lawrence, D ^a   Alvis, R ^a   Olson, D ^a  

^a Imago Scientific Instruments   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 49549115326     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927608083670     Document Type: Conference Paper

References (5)

1. M.K. Miller et al., "Atom Probe Field Ion Microscopy, Oxford University Press, Oxford, 1996.
2. T. F. Kelly and D. J. Larson, Materials Characterization 44/1-2 (2000) 59.
3. D. J. Larson et al., Acta Materialia 52(10) (2004) 2847.
4. K. Thompson et al., Ultramicroscopy 107(2-3) (2006) 131.
5. D. J. Larson et al., Ultramicroscopy 79 (1999) 287.