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Volumn 44, Issue 11 PART 2, 2008, Pages 3450-3453

Design of NI mold for discrete track media

Author keywords

Discrete track media; Electron beam lithography; Hard disk drive; Line width roughness; Ni mold

Indexed keywords

ELECTRON BEAM LITHOGRAPHY; ELECTRON BEAMS; HARD DISK STORAGE; MOLDS; NANOIMPRINT LITHOGRAPHY; NICKEL; SUBSTRATES;

EID: 69949123082     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2008.2002414     Document Type: Article
Times cited : (7)

References (6)
  • 2
    • 27744452649 scopus 로고    scopus 로고
    • Performance evaluation of discrete track perpendicular media for high recording density
    • DOI 10.1109/TMAG.2005.854777
    • Y. Soeno, M. Moriya, A. Kaizu, and M. Takai, "Performance evaluation of discrete track perpendicular media for high recording density", IEEE Trans. Magn., vol. 41, no. 10, pp. 3220-3222, Oct. 2005. (Pubitemid 41584407)
    • (2005) IEEE Transactions on Magnetics , vol.41 , Issue.10 , pp. 3220-3222
    • Soeno, Y.1    Moriya, M.2    Kaizu, A.3    Takai, M.4
  • 5
    • 77955131286 scopus 로고    scopus 로고
    • Influence of patterning fluctuation on read/write characteristics in discrete track and bit patterned media
    • M. Hashimoto et al., "Influence of patterning fluctuation on read/write characteristics in discrete track and bit patterned media", in Proc. Dig. PMRC, 2007, pp. 146-147.
    • (2007) Proc. Dig. PMRC , pp. 146-147
    • Hashimoto, M.1
  • 6
    • 0041361764 scopus 로고    scopus 로고
    • Characterization of line edge roughness in resist patterns by using fourier analysis a d Ayto-correlation function
    • A. Yamaguchi et al., "Characterization of line edge roughness in resist patterns by using fourier analysis a d Ayto-correlation function", Jpn. J. Appl. Phys., vol. 42, pp. 3763-3770, 2003.
    • (2003) Jpn. J. Appl. Phys. , vol.42 , pp. 3763-3770
    • Yamaguchi, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.