A comparison of pseudomorphic bcc phase stability in Zr/Nb and Ti/Nb thin film multilayers

Journal of Materials Research

Volumn 19, Issue 3, 2004, Pages 707-715

  Thompson, G B ^a,c   Banerjee, R ^a   Dregia, S A ^a   Miller, M K ^b   Fraser, H L ^a  

^a The Ohio State University   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

^c University of Alabama   (United States)

Author keywords

Crystallographic structure; Phase equilibria; Thin film

Indexed keywords

FILM PREPARATION; PHASE EQUILIBRIA; PHASE STABILITY; THIN FILMS; ZIRCONIUM;

BILAYER THICKNESS; CRYSTALLOGRAPHIC STRUCTURE; DIFFRACTION TECHNIQUES; PHASE STABILITY DIAGRAM; PHASE STABILIZATION; STABILITY BOUNDARIES; THIN FILM MULTILAYERS; TOTAL FREE ENERGY;

MULTILAYERS; PHASE EQUILIBRIA;

EID: 3042545509     PISSN: 08842914     EISSN: 20445326     Source Type: Journal    
DOI: 10.1557/jmr.2004.19.3.707     Document Type: Article

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