DC photoelectron gun parameters for Ultrafast electron microscopy

Microscopy and Microanalysis

Volumn 15, Issue 4, 2009, Pages 298-313

  Berger, Joel A ^a   Hogan, John T ^a   Greco, Michael J ^a   Schroeder, W Andreas ^a   Nicholls, Alan W ^a   Browning, Nigel D ^b,c  

^a UNIVERSITY OF ILLINOIS AT CHICAGO   (United States)

^b LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^c University of California Davis   (United States)

Author keywords

Electron microscopy; Emittance; Photoemission; Ultrafast

Indexed keywords

EID: 69949085166     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927609090266     Document Type: Conference Paper

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