Charge compensation by in-situ heating for insulating ceramics in scanning electron microscope

Ultramicroscopy

Volumn 109, Issue 11, 2009, Pages 1326-1332

  Wang, Li ^a   Ji, Yuan ^a   Wei, Bin ^a   Zhang, Yinqi ^a   Fu, Jingyong ^a   Xu, Xuedong ^a   Han, Xiaodong ^a  

^a BEIJING UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

Ceramics; Charge effect; Environmental scanning electron microscopy; Heating

Indexed keywords

ALN; CERAMICS; CHARGE COMPENSATION; CHARGE COMPENSATION MECHANISM; CHARGE EFFECT; COMPENSATION TEMPERATURE; CONVENTIONAL APPROACH; ELECTRON IONS; ELECTRONIC MICROSCOPES; ENVIRONMENTAL SCANNING; ENVIRONMENTAL SCANNING ELECTRON MICROSCOPY; HIGH VACUUM; IMAGE CONTRASTS; IN-SITU HEATING; INSULATING CERAMICS; INSULATING SURFACES; LOW VACUUM; PURE MAGNESIUM; SCANNING ELECTRON MICROSCOPE; SECONDARY ELECTRON IMAGES; SURFACE CONDUCTANCE; TEMPERATURE INCREASE; THERMAL PROPERTIES; TRAPPED ELECTRONS;

ALUMINA; ALUMINUM; ALUMINUM NITRIDE; CERAMIC MATERIALS; ELECTRON MICROSCOPES; ELECTRONS; HEATING; MAGNESIUM; NITRIDES; POLYMER BLENDS; SCANNING ELECTRON MICROSCOPY; SILICATES; SPONTANEOUS EMISSION; THERMODYNAMIC PROPERTIES; VACUUM;

SCANNING;

ALUMINUM DERIVATIVE; ALUMINUM OXIDE; MAGNESIUM SILICATE;

ARTICLE; CERAMICS; ELECTRIC CURRENT; ELECTRON; HEATING; HIGH TEMPERATURE; IMAGE QUALITY; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTY; THERMAL CONDUCTIVITY; VACUUM;

EID: 69749094160     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2009.06.004     Document Type: Article

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