Voltage sensitivity of Curie temperature in ultrathin metallic films

Physical Review B - Condensed Matter and Materials Physics

Volumn 80, Issue 1, 2009, Pages

  Ovchinnikov, Igor V ^a   Wang, Kang L ^a,b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b INSTITUTE OF SPECTROSCOPY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 69549138140     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.80.012405     Document Type: Article

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