Observation and model of highly ordered wavy cracks due to coupling of in-plane stress and interface debonding in silica thin films

Physical Review B - Condensed Matter and Materials Physics

Volumn 80, Issue 1, 2009, Pages

  Wan, Neng ^a   Xu, Jun ^a   Lin, Tao ^a   Xu, Ling ^a   Chen, Kunji ^a  

^a NANJING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 69549135495     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.80.014121     Document Type: Article

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