|
Volumn 67, Issue 6 2, 2003, Pages
|
Wavy and rough cracks in silicon
a a a a a a a |
Author keywords
[No Author keywords available]
|
Indexed keywords
ANISOTROPY;
ATOMIC FORCE MICROSCOPY;
COPPER;
CRACKS;
FRACTURE;
SINGLE CRYSTALS;
SURFACE ROUGHNESS;
TEMPERATURE CONTROL;
THERMAL GRADIENTS;
THIN FILMS;
MICROSTEPPER MOTOR;
SELF-AFFINE FRACTAL;
SINGLE CRYSTAL SILICON;
THIN FILM HEATER;
SILICON;
|
EID: 42749100517
PISSN: 1063651X
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (63)
|
References (17)
|