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Volumn 67, Issue 6 2, 2003, Pages

Wavy and rough cracks in silicon

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; ATOMIC FORCE MICROSCOPY; COPPER; CRACKS; FRACTURE; SINGLE CRYSTALS; SURFACE ROUGHNESS; TEMPERATURE CONTROL; THERMAL GRADIENTS; THIN FILMS;

EID: 42749100517     PISSN: 1063651X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (63)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.