Characterization of CdTe detectors for quantitative X-ray spectroscopy

IEEE Transactions on Nuclear Science

Volumn 56, Issue 4, 2009, Pages 2524-2532

  Redus, Robert H ^a   Pantazis, John A ^a   Pantazis, Thanos J ^a   Huber, Alan C ^a   Cross, Brian J ^b  

^a Amptek Inc   (United States)

^b NONE   (United States)

Author keywords

CdTe; CdTe detectors; Charge collection; X ray spectroscopy

Indexed keywords

CDTE; CDTE DETECTOR; CDTE DETECTORS; CHARACTERISTIC X RAYS; CHARGE COLLECTION; ELECTRONIC NOISE; ENERGY RANGES; ENERGY RESOLUTIONS; K X-RAY EMISSION; LIGHT ELEMENTS; LIMITED SENSITIVITY; QUANTITATIVE ANALYSIS; REPRODUCIBILITIES; SILICON DIODES; SOFTWARE ALGORITHMS; STOPPING POWER;

CADMIUM ALLOYS; CADMIUM COMPOUNDS; CHEMICAL ELEMENTS; DIODES; LAWS AND LEGISLATION; MERCURY (METAL); METAL DETECTORS; SEMICONDUCTING SILICON COMPOUNDS; SILICON DETECTORS; X RAY SPECTROMETERS; X RAY SPECTROSCOPY;

X RAYS;

EID: 69549092030     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2009.2024149     Document Type: Conference Paper

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