Atomically resolved Larmor frequency detection on Si (111) -7×7 oxide surface

Applied Physics Letters

Volumn 95, Issue 8, 2009, Pages

  Sainoo, Yasuyuki ^a,b   Isshiki, Hironari ^a   Shahed, Syed Mohammad Fakruddin ^a   Takaoka, Tsuyoshi ^a,b   Komeda, Tadahiro ^a,b  

^a TOHOKU UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC-SCALE RESOLUTION; ELECTRON SPIN RESONANCE; LARMOR FREQUENCIES; OXIDE SURFACE; OXYGEN ATOM; SCANNING TUNNELING MICROSCOPES; SI (1 1 1); SI DANGLING BONDS; SINGLE SPIN; SPIN SIGNAL;

ADATOMS; ATOMS; DANGLING BONDS; OXYGEN; SILICON;

SPIN DYNAMICS;

EID: 69549091969     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3204688     Document Type: Article

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