Fast, micrometer scale characterization of group-III nitrides with laboratory X-ray diffraction

Materials Science and Engineering: A

Volumn 524, Issue 1-2, 2009, Pages 82-88

  Krost, Alois ^a   Bläsing, Jürgen ^a  

^a OTTO VON GUERICKE UNIVERSITY   (Germany)

Author keywords

Concurrent X ray diffraction (CXRD); Convergent beam optics; Grazing incidence in plane X ray diffraction (GIIXRD); Group III nitrides

Indexed keywords

DIFFRACTOMETERS; NITRIDES;

BEAM OPTICS; CONCURRENT X-RAY DIFFRACTION; CONVERGENT BEAM OPTIC; CONVERGENT BEAMS; GRAZING INCIDENCE IN PLANE X-RAY DIFFRACTION; GRAZING-INCIDENCE IN-PLANE X-RAY DIFFRACTIONS; GROUP III NITRIDES; MICROMETER SCALE; MICROMETER-SCALE; X- RAY DIFFRACTIONS;

X RAY DIFFRACTION;

EID: 69249146059     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msea.2009.05.018     Document Type: Article

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