Effect of pH of colloidal suspension on crystallization and activation energy of deep levels in SnO2 thin films obtained via sol-gel

Journal of Physics and Chemistry of Solids

Volumn 70, Issue 9, 2009, Pages 1312-1316

  Ravaro, Leandro P ^a,b   dos Santos, Dayse I ^a   Scalvi, Luis V A ^a  

^a SÃO PAULO STATE UNIVERSITY UNESP   (Brazil)

^b POSMAT   (Brazil)

Author keywords

A. Oxides; A. Semiconductors; B. Sol gel growth; C. Thermogravimetric analysis (TGA); D. Electrical properties

Indexed keywords

A. OXIDES; A. SEMICONDUCTORS; B. SOL-GEL GROWTH; C. THERMOGRAVIMETRIC ANALYSIS (TGA); D. ELECTRICAL PROPERTIES;

ACTIVATION ENERGY; AGGLOMERATION; ARRHENIUS PLOTS; CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; FILM PREPARATION; GELATION; GELS; OXYGEN; OXYGEN VACANCIES; SEMICONDUCTOR GROWTH; SEMICONDUCTOR QUANTUM DOTS; SOL-GEL PROCESS; SOL-GELS; SOLS; SUSPENSIONS (FLUIDS); THERMOGRAVIMETRIC ANALYSIS; TIN; TIN DIOXIDE; X RAY DIFFRACTION;

PH EFFECTS;

EID: 69049113750     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpcs.2009.07.018     Document Type: Article

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