Origins for epitaxial order of sexiphenyl crystals on muscovite(00I)

Surface and Interface Analysis

Volumn 41, Issue 9, 2009, Pages 764-770

  Resel, R ^a   Haber, T ^a   Lengyel, O ^a   Sitter, H ^b   Balzer, F ^b   Rubahn, H G ^b  

^a GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

^b UNIVERSITY OF SOUTHERN DENMARK   (Denmark)

Author keywords

Organic epitaxy; Sexiphenyl; X ray diffraction

Indexed keywords

CRYSTAL DIRECTION; CRYSTAL SURFACES; EPITAXIAL ORIENTATIONS; EXPERIMENTAL OBSERVATION; IN-PLANE; LATTICE MISFITS; MUSCOVITE (001) SURFACE; ORGANIC EPITAXY; ORIENTED CRYSTALS; SEXIPHENYL; SUBSTRATE SURFACE; SUBSTRATE TEMPERATURE; THIN FILM MORPHOLOGY;

ATOMIC FORCE MICROSCOPY; CRYSTAL GROWTH; CRYSTALS; DIFFRACTION; FILM GROWTH; MICA; MOLECULAR BEAM EPITAXY; SUBSTRATES; THIN FILM DEVICES; THIN FILMS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

EPITAXIAL GROWTH;

EID: 68949211765     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3095     Document Type: Article

References (46)

1. M. A. Herman, H. Sitter, in Molecular Beam Epitaxy, Springer Verlag: Berlin, 1989.
2. J. Tersoff, R. M.Tromp, Phys. Rev. Lett. 1993, 70, 2782.
3. M.Gebhardt, A. Neuhaus, Epitaxie-Daten anorganischer und organischer Kristalle, in Landolt-BOrnstein NewSeries, ///(Springer Verlag: Berlin, 1972.
4. A. Koma, Prog. Crystal Growth Charact. 1995, 30, 129.
5. S.R.Forrest, Chem. Rev. 1997, 97, 1793.
6. G. Witte, C. Woll, J. Mater. Res. 2004, 19, 1889.
7. A. Langner, A. Hauschild, S. Fahrenholz, M. Sokolowski, Surf. Sci. 2005, 574, 153.
8. B. Winter, J. Ivanco, I. Salzmann, R. Resel, F. P. Netzer, M. G. Ramsey, Langumir 2004, 20, 7512.
9. S. Mullegger, A. Winkler, Surf. Sci. 2006, 600, 1290.
10. R. Franke, S. Franke, C. Wagner, T. Dienel, T. Fritz, S. C. B. Mannsfeld, Appl. Phys. Lett. 2006, 88, 161907.
11. C. Ludwig, B. Gompf, W. Glatz, J.Petersen, W. Eisenmenger, M. Mobus, U. Zimmermann, N. Karl, Z. Phys. B 1992, 86, 397.
12. K. Erlacher, R. Resel, J. Keckes, F. Meghdadi, G. Leising, J. Cryst. Growth 1999, 206, 135.
13. R. Resel, I. Salzmann, G. Hlawacek, C. Teichert, B. Koppelhuber, B. Winter, J. Krenn, J. Ivanco, M.G. Ramsey, Organic Electronics 2004, 5, 45.
14. A. Hoshino, S. Isoda, H. Kurata, T. Kobayashi, J. Appl. Phys. 1994, 76, 4113.
15. D.E. Hooks, T.Fritz, M.D.Ward, Adv.Mater. 2001, 13, 227.
16. T.Haber, S. Mullegger, A.Winkler, R. Resel, Phys.Rev.B 2006, 74, 454191.
17. P.Frank, G.Hlawacek, O. Lengyel, A. Satka, C.Teichert, R. Resel, A. Winkler, Surf. Sci. 2007, 60110, 2152.
18. F. Balzer, H.-G. Rubahn, Appl. Phys. Lett. 2001, 79, 3860.
19. A. Andreev, H. Sitter, C. J. Brabec, P. Hinterdorfer, G. Springholz, N. S. Sariciftci, Synth. Met. 2001, 121, 1379.
20. C.Teichert, G.Hlawacek, A.Yu. Andreev, H. Sitter, N. S. Sariciftci, A. Winkler, Appl. Phys. A 2006, 82, 665.
21. H. Plank, R. Resel, N. S. Sariciftci, A. Andreev, H. Sitter, G. Hlawacek, C. Teichert, A. Thierry, B. Lotz, Thin Solid Films 2003, 443, 108.
22. S. Berkebile, G. Koller, G. Hlawacek, C. Teichert, F. P. Netzer, M. G. Ramsey, Surf. Sci. 2006, 600, L313.
23. D. Nabok, C. Ambrosch-Draxl, P. Puschnig, Phys. Rev. B 2008, 77, 245316.
24. T. Haber, M.Oehzelt, A. Andreev, A. Thierry, H. Sitter, D.-M. Smilgies, B. Schaffer, W. Grogger, R. Resel, J. Nanosci. Nanotechnol. 2006, 6, 698.
25. T. Haber, R. Resel, A.Thierry, M.Campione, A. Sassella, M.Moret, Physica E 2008, 47, 133.
26. G. Koller, S. Berkebile, J. Krenn, G. Tzvetkov, G. Hlawacek, O. Lengyel, F. P. Netzer, C. Teichert, R. Resel, M. G. Ramsey, Adv. Mater. 2004, 76, 2159.
27. F. Balzer, H.-G. Rubahn, Surf. Sci. 2004, 548, 170.
28. O. Lengyel, A. Satka, T. Haber, J. KovaS, H. Sitter, R. Resel, Cryst. Res. Technol. 2008, 43, 44.
29. L.G.Schultz, J. Appl. Phys. 194Q, 20, 1030.
30. S. W. Bailey, Structures of layer silicates, in Crystal Structure of Clay Minerals and their X-ray Identification, Mineral Society Monograph, 5 Brindley GW, Brown G (eds). Mineralogical Society, London, 1980.
31. K.N.Baker, A.V.Fratini, T. Resch, H.C.Knachel, W.W.Adams, E. P. Socci, B. L. Farmer, Polymer 1993, 34, 1571.
32. R. Resel, J. Phys. Condens Matter 2008, 20, 184009.
33. W. Kraus, G. Nolze, J. Appl. Crystallogr. 1996, 29, 301.
34. I. Salzmann, R. Resel, J. Appl. Crystallogr. 2004, 37, 1029.
35. J. A. Last, A. C. Hillier, D. E. Hooks, J. B. Maxson, M. D. Ward, Chem. Mater. 1998, 70, 422.
36. C. A. Mitchell, L. Yu, M. D. Ward, J. Am. Chem. Soc. 2001, 723, 10830.
37. H. Plank, R. Resel, A. Andreev, N. S. Sariciftci, H. Sitter, J. Cyst. Growth 2002, 237-239, 2076.
38. S. C. B. Mannsfeld, T. Fritz, Phys. Rev. B 2005, 77, 235405.
39. G. Hlawacek, Q. Shen, C. Teichert, R. Resel, D. M. Smilgies, Surf.Sci. 2007, 607 , 2584.
40. Y. Kuwahara, Phys. Chem. Miner. 1999, 26, 198.
41. H. Plank, R. Resel, S. Purger, J. Keckes, A. Thierry, B. Lotz, A. Andreev, N. S. Sariciftci, H. Sitter, Phys. Rev. B 2001, 64, 235423.
42. M. Koini, T. Haber, O. Werzer, S. Berkebile, G. Koller, M. Oehzelt, M. Ramsey, R. Resel, Thin Solid Films 2008, 577, 483.
43. M. Koini, T. Haber, S. Berkebile, G. Koller, M. G. Ramsey, R. Resel, M. Oehzelt, J. Cryst. Growth 2009, 37 7, 1364.
44. D.-M. Smilgies, N. Boudet, B. Struth, Y. Yamada, H. Yanagi, J. Cryst. Growth 200Q, 220, 88.
45. D.-M. Smilgies, N. Boudet, H. Yanagi, Appl. Surf.Sci. 2002, 789, 24.
46. T. Haber, A. Andreev, A.Thierry, H. Sitter, M. Oehzelt, R. Resel, J. Cryst. Growth 2005, 284, 209.