Characterization of patterned poly(methyl methacrylate) brushes under various structures upon solvent immersion

Journal of Colloid and Interface Science

Volumn 338, Issue 2, 2009, Pages 428-434

  Chen, Jem Kun ^a   Hsieh, Chih Yi ^b   Huang, Chih Feng ^c   Li, Po min ^b  

^a NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^b NATIONAL PINGTUNG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^c NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

ATRP; Grafting density; PMMA brush; Surface coverage; Very large scale integration

Indexed keywords

ATRP; GRAFTING DENSITY; PMMA BRUSH; SURFACE COVERAGE; VERY-LARGE-SCALE INTEGRATION;

ACRYLIC MONOMERS; BRUSHES; ESTERS; FREE RADICAL REACTIONS; GRAFTING (CHEMICAL); LSI CIRCUITS; NETWORK ROUTING; OXYGEN; POLYMERIZATION; POLYMERS; SILICON WAFERS;

ATOM TRANSFER RADICAL POLYMERIZATION;

OXYGEN; POLY(METHYL METHACRYLATE); POLYMER; SILICON; SOLVENT; TETRAHYDROFURAN; WATER;

ACCURACY; ARTICLE; ATOM TRANSFER RADICAL POLYMERIZATION; CHEMICAL COMPOSITION; CHEMICAL STRUCTURE; COVALENT BOND; ELECTRON BEAM; IMMERSION; PRECIPITATION; PRIORITY JOURNAL;

FURANS; MOLECULAR STRUCTURE; PARTICLE SIZE; POLYMETHYL METHACRYLATE; SILICON; SOLVENTS; SURFACE PROPERTIES; WATER;

EID: 68949180208     PISSN: 00219797     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcis.2009.06.040     Document Type: Article

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