SCOPUS 정보 검색 플랫폼

Review of Scientific Instruments

Volumn 80, Issue 7, 2009, Pages

Photothermal technique using individual cantilevers for quality monitoring in thin film devices

(1) Gotoh, Tamihiro a

a GUNMA UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BENDING EFFECT; HEAT FLOWS; OPTICAL ABSORPTION SPECTRUM; OPTICAL DISKS; PHOTOTHERMAL TECHNIQUE; QUALITY MONITORING; SAMPLE STRUCTURE;

ATOMIC FORCE MICROSCOPY; LIGHT ABSORPTION; LIGHT TRANSMISSION; MONITORING; NANOCANTILEVERS; PHOTOEXCITATION; THERMAL STRESS; THIN FILM DEVICES; THIN FILMS;

THERMAL EXPANSION;

ALGORITHM; ARTICLE; INSTRUMENTATION; LASER; LIGHT; METHODOLOGY; SPECTROSCOPY; TEMPERATURE;

ALGORITHMS; LASERS; LIGHT; SPECTRUM ANALYSIS; TEMPERATURE;

EID: 68949105670 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.3169454 Document Type: Article

Times cited : (8)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.