Anomalous X-ray scattering study of the local structure in Ge-Se glasses

Physica Status Solidi (A) Applications and Materials Science

Volumn 206, Issue 8, 2009, Pages 1736-1739

  Hosokawa, S ^a,b   Oh, I ^c   Sakurai, M ^d   Pilgrim, W C ^b   Boudet, N ^e,f   Berar J F ^e,f  

^a HIROSHIMA INSTITUTE OF TECHNOLOGY   (Japan)

^b PHILIPPS UNIVERSITY MARBURG   (Germany)

^c OSAKA UNIVERSITY   (Japan)

^d TOHOKU UNIVERSITY   (Japan)

^e CNRS   (France)

^f UNIV GRENOBLE ALPES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION EDGES; ANOMALOUS X-RAY SCATTERING; CONCENTRATION RANGES; DIFFERENTIAL STRUCTURE; GE CONCENTRATIONS; GE-SE GLASS; GLASSY SYSTEMS; INTERMEDIATE RANGE ORDER; LOCAL STRUCTURE; PARTIAL CORRELATION; PRE-PEAK; RIGIDITY PERCOLATION THRESHOLDS; STRUCTURE FACTORS;

GERMANIUM; PERCOLATION (COMPUTER STORAGE); PERCOLATION (FLUIDS); PERCOLATION (SOLID STATE); RIGIDITY; SCATTERING; SEMICONDUCTING SELENIUM COMPOUNDS; SOLVENTS; X RAY SCATTERING;

SEMICONDUCTING GERMANIUM;

EID: 68649112078     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200881603     Document Type: Conference Paper

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