Partial structure analysis of glassy As2Se3 using anomalous X-ray scattering

Journal of Non-Crystalline Solids

Volumn 352, Issue 9-20 SPEC. ISS., 2006, Pages 1517-1519

  Hosokawa, S ^a,b   Wang, Y ^c   Pilgrim, W C ^b   Berar J F ^d   Mamedov, S ^e   Boolchand, P ^e  

^a HIROSHIMA INSTITUTE OF TECHNOLOGY   (Japan)

^b Kern   (Germany)

^c OSAKA UNIVERSITY   (Japan)

^d LABORATOIRE DE CRISTALLOGRAPHIE   (France)

^e University of Cincinnati   (United States)

Author keywords

Amorphous semiconductors; Chalcohalides; Medium range order; Short range order; Synchrotron radiation; X ray diffraction

Indexed keywords

AMORPHOUS MATERIALS; CORRELATION METHODS; SEMICONDUCTOR MATERIALS; SYNCHROTRON RADIATION; X RAY SCATTERING;

AMORPHOUS SEMICONDUCTORS; CHALCOHALIDES; MEDIUM-RANGE ORDER; SHORT-RANGE ORDER;

ARSENIC COMPOUNDS;

EID: 33745451335     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2005.12.026     Document Type: Article

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