Magneto-optical investigations of lzo buffer layer thickness effects on ybco microstructure in the simple niw/lzo/ybco structure

IEEE Transactions on Applied Superconductivity

Volumn 19, Issue 3, 2009, Pages 3184-3187

  Caroff, T ^a   Porcar, L ^b   Chaudouet, P ^a   Abrutis, A ^c   Jimenez, C ^a   Odier, P ^b   Weiss, F ^a  

^a LABORATOIRE DES MATÉRIAUX ET DU GÉNIE PHYSIQUE   (France)

^b LABORATOIRE DE CRISTALLOGRAPHIE   (France)

^c VILNIUS UNIVERSITY   (Lithuania)

Author keywords

Coated conductors; EBSD; Magneto optical imaging; Microstructure

Indexed keywords

BUFFER LAYER THICKNESS; COATED CONDUCTORS; EBSD; ELECTRON BACK-SCATTERED DIFFRACTION; FLUX DISTRIBUTIONS; HETEROSTRUCTURES; INTRINSIC DEFECTS; MAGNETO-OPTICAL; MAGNETO-OPTICAL IMAGING; MAGNETO-OPTICS; METAL ORGANIC DECOMPOSITION; METALORGANIC CHEMICAL VAPOR DEPOSITION; NI SUBSTRATES; SEM; STRUCTURAL COMPATIBILITY; XRD; YBCO FILM;

BUFFER LAYERS; CHEMICAL VAPOR DEPOSITION; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); ELECTRON DIFFRACTION; FILM GROWTH; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; LIGHT; LIGHT TRANSMISSION; MAGNETOS; MICROSTRUCTURE; NICKEL; OPTICAL IMAGE STORAGE; SUPERCONDUCTING FILMS; SUPERCONDUCTIVITY; YTTRIUM BARIUM COPPER OXIDES; ZIRCONIUM;

SUBSTRATES;

EID: 68649089465     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2009.2017702     Document Type: Conference Paper

References (17)

1. C. Jooss, J. Albrecht, H. Kuhn, S. Leonhardt, and H. Kronmuller, Rep. Prog. Phys., vol. 65, p. 651, 2002.
2. R. J. Wijngaarden, R. Surdeau, R. Griessen, A. A. Menovsky, J. Fendrich, and W. K. Kwok, Physica C, vol. 282-287, p. 2291, 1997.
3. F. Laviano, D. Botta, A. Chiodoni, R. Gerbaldo, G. Ghigo, L. Gozzelino, S. Zanella, and E. Mezzeti, Supercond. Sci. Technol., vol. 16, p. 71, 2003.
4. A. Villaume, L. Porcar, D. Bourgault, A. Antonevici, T. Caroff, J. P. Leggeri, and C. Villard, Supercond. Sci. Technol., vol. 21, p. 34009, 2008.
5. T. Caroff, S. Morlens, A. Abrutis, M. Decroux, P. Chaudouët, L. Porcar, Z. Saltyte, C. Jiménez, P. Odier, and F. Weiss, Supercond. Sci. Technol., vol. 21, p. 75007, 2008.
6. K. Knoth, R. Huhne, S. Oswald, L. Molina, O. Eibl, L. Schultz, and B. Holzapfel, Thin Solid Films, vol. 516, pp. 2099-2108, 2008.
7. M. P. Paranthaman, S. Sathyamurthy, M. S. Z. Bhuiyan, P. M. Martin, T. Aytug, K. Kim, M. Fayek, K. J. Leonard, J. Li, A. Goyal, T. Ko- denkandath, W. Li, W. Zhang, and M. W. Rupich, IEEE Trans. Appl. Supercond., vol. 17, no. 2, pp. 3332-3335, 2007.
8. O. Stadel, R. Muydinov, H. Keune, J. Schmidt, A. Blednov, G. Dosovitsky, S. Samoylenkov, O. Gorbenko, A. Kaul, G. Kotzyba, R. Nast, and W. Goldacker, Journal of Physics, Conference Series 97,p. 012158, 2008.
9. S.-H. Wee, A. Goyal, H. Hsu, J. Li, L. Heatherly, K. Kim, T. Aytug, S. Sathyamurthy, and M. P. Paranthaman, J. Amer. Ceram. Soc., vol. 9011, pp. 3529-3535, 2007.
10. M. P. Paranthaman, S. Sathyamurthy, M. S. Bhuiyan, P. M. Martin, T. Aytug, K. Kim, M. Fayek, K. J. Leonard, J. Li, A. Goyal, T. Kodenkan- dath, W. Li, W. Zhang, and M. W. Rupich, IEE Trans. Appl. Sup., vol. 17, pp. 3332-3335, 2007.
11. J. W. Seo, J. Fompeyrine, A. Guiller, G. Norga, C. Marchiori, H. Sieg- wart, and J. P. Locquet, Appl Phys Lett, vol. 85, no. 25, pp. 5211-5213, 2003.
12. J. L. Soubeyroux, C. E. Bruzek, A. Girard, and J. L. Jorda, IEEE Trans. Appl. Supercond., vol. 15, pp. 2687-2690, 2005.
13. S. Morlens, Z. M. Yu, N. Marcellin, and T. Caroff et al, Chem., submitted for publication.
14. A. Villaume, A. Antonevici, D. Bourgault, L. Porcar, J. P. Leggeri, and C. Villard, Supercond. Sci. Technol., vol. 20, p. 1019, 2007.
15. D. M. Feldmann et al., IEEE Trans. Appl. Supercond., vol. 11, pp. 3772-3775, 2001.
16. D. M. Feldmann et al., Appl. Phys. Lett., vol. 77, p. 2906, 2000.
17. D. C. Van Der Laan, M. Dhalle, H. J. N. Van Eck, A. Metz, B. Ten Haken, H. H. J. Ten Kate, L. M. Naveira, M. W. Davidson, and J. Schwartz, Appl. Phys. Lett., vol. 3, p. 32512, 2005.