On the measurement of lattice parameters in a collection of nanoparticles by transmission electron diffraction

Ultramicroscopy

Volumn 103, Issue 2, 2005, Pages 165-172

  Schamp, C T ^a   Jesser, W A ^a  

^a University of Virginia   (United States)

Author keywords

Microscopic methods; Specifically for catalysts and small particles

Indexed keywords

CARBON; COPPER; ELECTRON DIFFRACTION; MAGNETIC FIELD EFFECTS; NANOSTRUCTURED MATERIALS; STATISTICAL METHODS; THIN FILMS; VAPOR DEPOSITION;

AMORPHOUS CARBON; INTERPLANAR SPACINGS; TRANSMISSION ELECTRON DIFFRACTION;

LATTICE CONSTANTS;

CARBON; COPPER; GOLD; NANOPARTICLE;

ACCURACY; ARTICLE; CAMERA; FILM; INFORMATION PROCESSING; MAGNETIC FIELD; MEASUREMENT; RADIUS; STATISTICAL ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY; VAPOR; X RAY DIFFRACTION;

EID: 14844344028     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2004.11.007     Document Type: Article

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