Comparison of inter-diffusion coefficients for Ni/Cu thin films determined from classical heating analysis and linear temperature ramping analysis by means of profile reconstruction and a numerical solution of Fick's law

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 267, Issue 16, 2009, Pages 2575-2578

  Joubert, H D ^a   Terblans, J J ^a   Swart, H C ^a  

^a UNIVERSITY OF THE FREE STATE   (South Africa)

Author keywords

Diffusion; Linear temperature ramping; Thin films

Indexed keywords

ANNEALING PROCEDURES; ANNEALING TEMPERATURES; ANNEALING TIME; CONSTANT TIME; DIFFUSION COEFFICIENTS; FICK'S LAW; FICK'S SECOND LAW; HEAT TRANSFER MECHANISM; HEATING ANALYSIS; INFORMATION MODELS; INTER-DIFFUSION; LINEAR TEMPERATURE; LINEAR TEMPERATURE RAMPING; NUMERICAL SOLUTION; PROFILE RECONSTRUCTION; ROOM TEMPERATURE; SAMPLE TEMPERATURE;

DIFFUSION; HEAT EXCHANGERS; HEAT TRANSFER; LAWS AND LEGISLATION; THIN FILMS;

ANNEALING;

EID: 68349157404     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2009.05.047     Document Type: Article

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