Mixed valence europium nitridosilicate Eu2SiN3

Journal of the American Chemical Society

Volumn 131, Issue 31, 2009, Pages 11242-11248

  Zeuner, Martin ^a   Pagano, Sandro ^a   Matthes, Philipp ^a   Bichler, Daniel ^a   Johrendt, Dirk ^a   Harmening, Thomas ^b   Pöttgen, Rainer ^b   Schnick, Wolfgang ^a  

^a UNIVERSITY OF MUNICH   (Germany)

^b UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BAND GAPS; BLACK MATERIALS; CHAIN SILICATE; CHAIN-TYPE; CONSTANT RATIO; CURIE-WEISS BEHAVIORS; DFT CALCULATION; DIIMIDE; EFFECTIVE MAGNETIC MOMENTS; FERROMAGNETIC ORDERINGS; HIGH TEMPERATURE; INDEPENDENT REFLECTIONS; ISOSTRUCTURAL; MAGNETIC HYPERFINE FIELD; MAGNETIC SUSCEPTIBILITY MEASUREMENTS; MIXED VALENCE; NITRIDOSILICATES; ONE-DIMENSIONAL; SINGLE CRYSTAL X-RAY DIFFRACTION ANALYSIS; SSBAUER SPECTROSCOPY; TEMPERATURE RANGE; TIO; WYCKOFF POSITIONS;

CALCIUM; CRYSTAL STRUCTURE; MAGNETIC MOMENTS; MAGNETIC SUSCEPTIBILITY; PROBABILITY DENSITY FUNCTION; RUBIDIUM; SILICATES; SILICON NITRIDE; SULFUR COMPOUNDS; SYNTHESIS (CHEMICAL); TANTALUM; X RAY DIFFRACTION ANALYSIS;

EUROPIUM;

EUROPIUM; FERROMAGNETIC MATERIAL; LITHIUM; SILICATE; SILICON DERIVATIVE; TANTALUM;

AMPOULE; ARTICLE; ATOM; CALCULATION; CHEMICAL STRUCTURE; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; DENSITY FUNCTIONAL THEORY; HIGH TEMPERATURE; MAGNETIC FIELD; SPECTROSCOPY; SYNTHESIS; X RAY DIFFRACTION;

EID: 68249161924     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja9040237     Document Type: Article

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