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Volumn 240, Issue 1-2, 1996, Pages 33-36

Preparation and crystal structure of a new barium silicon nitride, Ba5Si2N6

Author keywords

Barium silicon nitride; Crystal structure; Na flux; Nitridometallate anion; Single crystal

Indexed keywords

COOLING; CRYSTAL GROWTH; CRYSTAL STRUCTURE; CRYSTAL SYMMETRY; CRYSTALLIZATION; SINGLE CRYSTALS; SYNTHESIS (CHEMICAL); TERNARY SYSTEMS; X RAY CRYSTALLOGRAPHY; X RAY POWDER DIFFRACTION;

EID: 0030190341     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/0925-8388(96)02242-6     Document Type: Article
Times cited : (95)

References (34)
  • 17
    • 85027673675 scopus 로고    scopus 로고
    • Siemens Analytical X-Ray Instruments, Inc., 6300 Enterprise Lane, Madison, WI 53719
    • XEMP Software, Siemens Analytical X-Ray Instruments, Inc., 6300 Enterprise Lane, Madison, WI 53719.
    • XEMP Software
  • 19
    • 0004150157 scopus 로고    scopus 로고
    • Siemens Analytical X-ray Instruments, Inc., 6300 Enterprise Lane, Madison, WI 53719
    • G.M. Sheldrick, SHELXTL Software, PC Version 5.0, Siemens Analytical X-ray Instruments, Inc., 6300 Enterprise Lane, Madison, WI 53719.
    • SHELXTL Software, PC Version 5.0
    • Sheldrick, G.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.