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Volumn 19, Issue 15, 2009, Pages 2423-2430

Characterization, cathodolutumescence, and fieldemission properties of morphology-tunable CdS micro/nanostructures

Author keywords

[No Author keywords available]

Indexed keywords

BAND-EDGE EMISSIONS; CDS; DEEP LEVEL EMISSION; DEFECT CONCENTRATIONS; FIELD EMISSION MEASUREMENTS; FIELD ENHANCEMENT FACTOR; FIELD-EMISSION CHARACTERISTICS; FIELD-EMISSION PROPERTIES; HIGH QUALITY; INTENSITY RATIO; MICRO WIRE; MICRO/NANOSTRUCTURES; MICRORODS; ONE-DIMENSIONAL; THRESHOLD FIELDS; TURN-ON FIELD; VACUUM GAP;

EID: 68249131520     PISSN: 1616301X     EISSN: 16163028     Source Type: Journal    
DOI: 10.1002/adfm.200900295     Document Type: Article
Times cited : (128)

References (64)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.