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Applied Physics Letters

Volumn 95, Issue 4, 2009, Pages

Tapered photoconductive terahertz field probe tip with subwavelength spatial resolution

(3) Wächter, Markus a Nagel, Michael a Kurz, Heinrich a

a RWTH AACHEN UNIVERSITY (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD ENHANCEMENT; FAR FIELD MEASUREMENT; LOW-TEMPERATURE-GROWN GAAS; METALLIC STRUCTURES; METALLIC WIRE; NONRESONANT; PROBE TIPS; SCANNING NEAR-FIELD OPTICAL MICROSCOPY; SPATIAL RESOLUTION; SPATIALLY RESOLVED; SUB-WAVELENGTH; TERA HERTZ; TERAHERTZ FIELDS; TERAHERTZ FREQUENCIES;

ELECTRIC FIELDS; PHOTOCONDUCTIVITY; PROBES;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

EID: 68249087108 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3189702 Document Type: Article

Times cited : (112)

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