In situ observation of phase formation in a Cu-In-2Se precursor layer using micro-Raman scattering spectroscopy

Journal of Materials Research

Volumn 24, Issue 7, 2009, Pages 2373-2377

  Wang, Deliang ^a   Cao, Yongsheng ^a   Wan, Lei ^a  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS PRECURSORS; ATOMIC RATIO; ATOMIC STRUCTURE; IN-SITU OBSERVATIONS; MICRO-RAMAN SCATTERING; OUT-DIFFUSION; PHASE FORMATIONS; PRECURSOR LAYER; SELENIDES; TEMPERATURE DEPENDENT;

ATOMS; COPPER COMPOUNDS; RAMAN SCATTERING; SELENIUM COMPOUNDS; VAPOR PRESSURE;

ATOMIC SPECTROSCOPY;

EID: 68149141754     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/jmr.2009.0283     Document Type: Article

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