Optical transmittance study by Using a modified envelope analysis for Al-ZnO thin films

Journal of the Korean Physical Society

Volumn 54, Issue 6, 2009, Pages 2396-2399

  Seong, Junje ^a   Kim, Deuk Young ^a   Lee, Sejoon ^a  

^a Dongguk University   (South Korea)

Author keywords

Al doped ZnO; Modified envelope analysis; Optical parameter; Transparent conductive oxide

Indexed keywords

EID: 68149099740     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: 10.3938/jkps.54.2396     Document Type: Article

References (15)

1. G. J. Exarhos and X. Zhou, Thin Solid Films 515, 7025(2007).
2. A. N. Banerjee and K. K. Chattopadhyay, Prog. Cryst. Growth Charact. Mater. 50, 52(2005).
3. C. G. Granqvist and A. Hultaker, Thin Solid Films 411, 1(2002).
4. M. Kemell, F. Dartigues, M. Ritala and M. Leskela, Thin Solid Films 434, 20(2003).
5. M. Batzill and U. Diebold, Prog. Surf. Sci. 79, 47(2005).
6. K. Ellmer, J. Phys. D: Appl. Phys. 34, 3097(2001).
7. S. Sheng, G. J. Fang, C. Li, S. Xu and X. Z. Zhao, Phys. Stat. Sol. A 203, 1891(2006).
8. S. H. Jeong, B. N. Park, D. G. Yoo, J. H. Boo and D. Jung, J. Korean Phys. Soc. 50, 622(2007).
9. J. C. Lee, Y. D. Kim, J. H. Lee, Y. S. Kim, C. S. Son and P. K. Song, J. Korean Phys. Soc. 53, 416(2008).
10. K. Lin and P. Tsai, Thin Solid Films 515, 8601(2007).
11. V. Bhosle, A. Tiwari and J. Narayan, Appl. Phys. Lett. 88, 032106(2006).
12. J. A. Sans, G. Martinez-Criado, J. Pellicer-Porres, J. F. Sánchez-Royo and A. Segura, Appl. Phys. Lett. 91, 221904(2007).
13. J. C. Manifacier, J. Gasiot and J. P. Fillard, J. Phys. E: Sci. Instrum. 9, 1002(1976).
14. R. Swanepoel, J. Phys. E: Sci. Instrum. 16, 1214(1983).
15. C. H. Peng and S. B. Desu, J. Am. Ceram. Soc. 77, 929(1994).